Shenzhen, China

Longfei Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Longfei Zhang. Retrieved from https://idiyas.com/inventor/longfei-zhang-2cxd3le9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Longfei Zhang: Innovator in All-Optical Detection Systems

Introduction

Longfei Zhang is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of optical detection technology. His innovative work focuses on developing advanced systems that enhance the efficiency and effectiveness of light detection.

Latest Patents

Longfei Zhang holds a patent for an all-optical detector and detection system, as well as a response time test system and a manufacturing method. This invention features a micro-nanofiber that includes an optical resonant cavity arranged in a uniformity zone. The all-optical detector operates by detecting light through changes in a resonance peak, achieving high signal-to-noise ratios.

Career Highlights

Zhang is affiliated with Shenzhen University, where he continues to advance research in optical technologies. His work has garnered attention for its potential applications in various fields, including telecommunications and sensor technology.

Collaborations

He collaborates with notable colleagues such as Ying Wang and Yiping Wang, contributing to a dynamic research environment that fosters innovation.

Conclusion

Longfei Zhang's contributions to all-optical detection systems exemplify the impact of innovative thinking in technology. His work not only advances scientific understanding but also paves the way for future developments in optical detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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