Shanghai, China

Long Wen Lan

This inventor holds 7 USPTO granted patents and 4 published patent applications. Top assignee: International Business Machines Corporation. Active years: 2011-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Long Wen Lan. Retrieved from https://idiyas.com/inventor/long-wen-lan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 42.9

Average Co-Inventor Count = 3.9

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2011-2022

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7 patents (USPTO):Explore Patents

Title: Long Wen Lan - Pioneering Inventor from Shanghai

Introduction: Long Wen Lan is a distinguished inventor hailing from the vibrant city of Shanghai, China. His innovative spirit and dedication to technological advancements have made him a prominent figure in the world of patents and inventions.

Latest Patents: Long Wen Lan's recent patents focus on cutting-edge technologies in the fields of artificial intelligence, renewable energy, and sustainable urban development. His inventions have garnered international recognition for their creativity and practicality.

Career Highlights: With a career spanning over two decades, Long Wen Lan has established himself as a trailblazer in the innovation landscape. He has worked with leading research institutions and multinational companies to bring his ideas to life and transform industries.

Collaborations: Long Wen Lan has collaborated with top universities and tech companies to push the boundaries of innovation. His partnerships have resulted in groundbreaking inventions that have the potential to shape the future of technology.

Conclusion: Long Wen Lan's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor. His contributions to the world of patents and inventions continue to inspire the next generation of innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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