Ho Chi Minh, Vietnam

Long Hai Nguyen



Average Co-Inventor Count = 7.9

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022-2025

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2 patents (USPTO):Explore Patents

Title: Innovator Long Nguyen: Advancing Radar Technology

Introduction

Long Nguyen, based in Ho Chi Minh, Vietnam, is a notable inventor recognized for his contributions to radar scanning technology. With a focus on improving efficiency and coverage, Nguyen has secured a patent that enhances the capabilities of handheld scanner systems. His commitment to innovation marks him as a key player in the field.

Latest Patents

Nguyen's primary patent, titled "Systems and methods for improved radar scanning coverage and efficiency," specifically addresses the challenge of sizing irregularly shaped objects. The invention includes methods such as displaying a 3D optical figure of a subject, superimposing a grid on that figure, and utilizing a radar module to gather range data. This innovative approach allows for the dynamic representation of range data through visual characteristics, providing users with real-time feedback during the scanning process.

Career Highlights

Long Nguyen is currently employed at Bodidata, Inc., where he continues to push the boundaries of technological advancements. His work in radar technology signifies a substantial step forward in the evaluation and analysis of irregularly shaped objects, making significant contributions to both industry and research applications.

Collaborations

Throughout his career at Bodidata, Nguyen collaborates with other talented professionals, including Albert J. Charpentier and Michael Boylan. Their combined expertise fosters a rich environment for innovation, driving forward projects aimed at enhancing radar scanning technologies.

Conclusion

As an innovative and dedicated inventor, Long Nguyen exemplifies the spirit of ingenuity in the field of radar technology. His patented systems and methodologies reflect a commitment to enhancing efficiency and functionality in the scanning process, paving the way for future advancements in the industry.

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