Shanghai, China

Long Bai


Average Co-Inventor Count = 12.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):

Title: Long Bai: Innovator in Measurement Technology

Introduction

Long Bai is a distinguished inventor based in Shanghai, China. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of displacement and attitude measurement devices.

Latest Patents

Long Bai holds a patent for a "Quasi-zero-stiffness based six-degree-of-freedom absolute displacement and attitude measurement device." This invention introduces a novel approach to measuring displacement and attitude by utilizing a quasi-zero-stiffness mechanism. The device employs a lower end coil and an upper end coil, which are charged with currents in opposite directions. This configuration creates an electromagnetic stiffness that counteracts the stiffness of a spring, resulting in a system that approaches zero stiffness. When the platform to be measured undergoes motion, the reference platform remains stationary, allowing for precise measurement of deformation amounts through laser displacement sensors. The data collected is then processed to determine the displacement and attitude of the platform.

Career Highlights

Throughout his career, Long Bai has worked at prominent institutions such as Chongqing University and Shanghai University. His experience in these academic environments has contributed to his expertise in measurement technologies and has facilitated his innovative research.

Collaborations

Long Bai has collaborated with notable colleagues, including Huayan Pu and Jinglei Zhao. These partnerships have likely enriched his research and development efforts, leading to advancements in measurement technology.

Conclusion

Long Bai is a remarkable inventor whose work in measurement technology has the potential to impact various industries. His innovative patent demonstrates his commitment to advancing the field and improving measurement accuracy.

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