Liyue Ge

Title: Liyue Ge: Innovator in Image Processing Technology

Introduction

Liyue Ge is a prominent inventor based in Nanchang, China. He has made significant contributions to the field of image processing, particularly in generating industrial defect images. His innovative approach has the potential to enhance quality control processes in various industries.

Latest Patents

Liyue Ge holds a patent titled "Method for generating industrial defect image, device, medium, and product." This patent relates to the field of image processing and outlines a method that includes acquiring an industrial defect-free image and generating an industrial defect image using a defect image generation model. The model is constructed based on a cyclic Generative Adversarial Network (GAN) and includes two generators and two discriminators. Each generator consists of an encoder, a transformer, and a decoder connected in sequence. The encoder extracts features from the input image, the transformer applies a self-attention-based residual network, and the decoder utilizes a skip connection mechanism and deconvolution operations to produce the generated image.

Career Highlights

Liyue Ge is affiliated with Nanchang Hangkong University, where he continues to advance his research in image processing technologies. His work has garnered attention for its innovative methodologies and practical applications in industrial settings.

Collaborations

Liyue Ge collaborates with notable colleagues, including Congxuan Zhang and Shijie Zhang, who contribute to his research endeavors and enhance the collaborative environment within their institution.

Conclusion

Liyue Ge's contributions to image processing through his patented methods demonstrate his commitment to innovation and excellence in technology. His work not only advances academic research but also has practical implications for industries reliant on image analysis.