Tianjin, China

Liyi Chen

This inventor holds 1 USPTO granted patent. Top assignee: Civil Aviation University of China. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Liyi Chen. Retrieved from https://idiyas.com/inventor/liyi-chen-0zl6zgb2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Liyi Chen and Runway Water Monitoring Innovation.

Introduction

Liyi Chen is an inventor associated with the Civil Aviation University of China in Tianjin, China. His work includes a patented device designed to monitor water accumulation and water-film thickness on airport runways in real time.

Latest Patents

Chen is associated with 1 patent: “Real-Time Monitoring Device for Accumulated Water Distribution and Water Film Thickness on Airport Runway.” The device combines an infrared thermal imager, a camera, a far-infrared heater, a protective cover, and a data-processing module. The module connects to the heater and imaging components, which are housed together in the protective cover. The design is intended to provide a long detection distance and operate without being limited by lighting conditions, enabling real-time monitoring of runway water distribution and film thickness.

Career Highlights

Chen’s patent addresses runway-safety monitoring by applying thermal imaging and camera-based observation to detect water conditions. The invention is associated with the Civil Aviation University of China.

Collaborations

The provided information identifies Jing Cai and Kai Wang as Chen’s coworkers. It does not specify their roles in developing the patented device.

Conclusion

Liyi Chen’s runway-monitoring invention combines thermal and visual sensing to support real-time assessment of accumulated water and water-film thickness, with the aim of improving the monitoring of airport runway conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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