This inventor holds 1 USPTO granted patent. Top assignee: Chengdu Aircraft Industrial (Group) Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Liya Han in Aircraft Surface Measurement
Introduction
Liya Han is an accomplished inventor based in Chengdu, China. He has made significant contributions to the field of aircraft surface measurement. His innovative approach focuses on enhancing the accuracy and efficiency of three-dimensional measurements.
Latest Patents
Liya Han holds a patent for a "Three-dimensional measurement method and system for key morphological features on aircraft surface." This invention discloses a method and system that utilizes the distribution characteristics of point clouds. It forms an angle between the direction vector of the measurement point and the seam direction. This ensures that the point clouds can gradually approach the actual edge of the seam, effectively eliminating randomness. The method selects the nearest point in the point clouds on both sides of the seam, overcoming limitations related to point cloud density. This innovation significantly reduces the distance between the selected nearest point and the actual edge of the seam.
Career Highlights
Liya Han is currently employed at Chengdu Aircraft Industrial (Group) Co., Ltd. His work has been pivotal in advancing measurement techniques in the aerospace industry. His dedication to innovation has positioned him as a key figure in his field.
Collaborations
Liya collaborates with talented coworkers, including Shuntao Liu and Ying Xie. Their combined expertise fosters a creative environment that drives innovation in aircraft technology.
Conclusion
Liya Han's contributions to three-dimensional measurement methods represent a significant advancement in aircraft surface technology. His innovative patent showcases his commitment to improving measurement accuracy and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile