This inventor holds 1 USPTO granted patent. Top assignee: University of Florida Research Foundation Inc.. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Liu He - Innovator in Strain Analysis Technology
Introduction
Liu He is a prominent inventor based in Gainesville, FL (US). She has made significant contributions to the field of strain analysis through her innovative patent. Her work focuses on developing a system and method for strain measurement that utilizes a unique coating technology.
Latest Patents
Liu He holds a patent titled "System, method, and coating for strain analysis." This invention relates to a strain-sensitive coating and a strain measurement system designed to determine strains on substrate materials. The system includes a luminescent strain-sensitive coating and a strain field mapping system, which can create a strain map of the mechanical strain on various substrate materials. The luminescent coating is polymer-based and can incorporate multiple luminescent compounds. This coating can be applied to produce a thin film on materials such as aluminum, steel, polymer, or composite. The characteristics of the luminescence from the coating vary in relation to the strain on the substrate material, allowing for precise strain measurement.
Career Highlights
Liu He is affiliated with the University of Florida Research Foundation Inc., where she continues to advance her research in strain analysis technology. Her innovative approach has garnered attention in the scientific community, contributing to advancements in material science and engineering.
Collaborations
Liu He has collaborated with notable colleagues, including Kirk S Schanze and David A Jenkins. These partnerships have enhanced her research and expanded the impact of her inventions in the field.
Conclusion
Liu He is a trailblazer in the realm of strain analysis technology, with her patent showcasing her innovative spirit and dedication to advancing scientific knowledge. Her contributions are paving the way for future developments in material strain measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
