Seattle, WA, United States of America

Liping Zhou

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Liping Zhou. Retrieved from https://idiyas.com/inventor/liping-zhou-krv9b772

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Liping Zhou - Innovator in X-ray Imaging Technology

Introduction

Liping Zhou is a notable inventor based in Seattle, WA, who has made significant contributions to the field of medical imaging. His innovative work focuses on enhancing the quality of X-ray images, particularly in the context of stent imaging.

Latest Patents

Liping Zhou holds a patent for a method titled "Method of deformable motion correction and image registration in X-ray stent imaging." This method provides advanced image processing techniques that are particularly effective for aligning stent images. Ultimately, it enhances the quality of stent images, which is crucial for accurate medical assessments.

Career Highlights

Liping Zhou is associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to collaborate with other experts in the field and contribute to groundbreaking advancements in medical imaging technology.

Collaborations

One of his notable collaborators is Ying Zhu, who has worked alongside him on various projects. Their combined expertise has led to significant improvements in the field of X-ray imaging.

Conclusion

Liping Zhou's contributions to X-ray imaging technology exemplify the impact of innovative thinking in the medical field. His patent and work at Siemens highlight the importance of advancements in medical imaging for improving patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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