Muri bei Bern, Switzerland

Lior Kimron

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Lem Surgical Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lior Kimron. Retrieved from https://idiyas.com/inventor/lior-kimron-dxqb7k8n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Lior Kimron and Surgical Navigation Innovation.

Introduction

Lior Kimron is an inventor based in Muri bei Bern, Switzerland. His work includes an invention designed to support image registration and robotic navigation during surgery.

Latest Patents

Kimron is associated with one patent, titled “Single Origin Marker Assemblies and Methods for Their Use.” The invention describes an integrated marker system for registering pre-operative images with a surgical robot and supporting robotic navigation during a procedure. A registration marker is removably attached to a navigation marker in a predetermined orientation. The system can be placed on a patient’s bone anatomy for initial registration; afterward, the registration marker can be removed while the navigation marker remains available for navigation and patient tracking. Kimron’s reported patent count is 1 patent.

Career Highlights

Kimron is associated with Lem Surgical AG. The marker system described in his patent addresses the transition from image registration to ongoing robotic navigation during surgery.

Collaborations

Kimron’s coworker is Matvey Rzhavskiy. Their professional association is connected to the surgical technology work described here.

Conclusion

Lior Kimron’s patent focuses on an integrated marker approach that links pre-operative image registration with robotic navigation and patient tracking during surgery.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…