Linmao Qian

Title: Exploring the Innovations of Inventor Linmao Qian

Introduction

Linmao Qian, based in Chengdu, China, is a distinguished inventor with a notable contribution to the field of atomic force microscopy. With two patents to his name, Qian has demonstrated remarkable ingenuity and technical prowess in advancing the capabilities of probe-based instruments.

Latest Patents

Qian's latest patents highlight his innovative spirit. The first, titled "Numerically controlled rotary probe switching device based on environment-controllable atomic force microscope," describes a sophisticated device designed to enhance the functionality of atomic force microscopes. This invention features a cavity upper cover designed with an irregular rectangular boss, accommodation for a probe switching structure, and an advanced optical window structure, allowing for precise measurements and control.

His second patent, "Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact," presents a comprehensive method for creating a specialized probe. This patent includes theoretical models and design criteria tailored for an irregularly shaped microcantilever, aimed at achieving high precision in measuring ultra-low friction coefficients at the nanoscale.

Career Highlights

Linmao Qian has cultivated his expertise while working at prestigious institutions in China, including Southwest Jiaotong University and Tsinghua University. His academic and research positions have allowed him to explore advanced concepts in materials science and engineering, mainly pertaining to nanoscale measurements and instrumentation.

Collaborations

Throughout his career, Qian has collaborated with distinguished colleagues, including Liang Jiang and Jianbin Luo. These partnerships have been pivotal in driving innovation and expanding research possibilities in his field.

Conclusion

Linmao Qian's contributions to the world of atomic force microscopy and probe technology reflect his dedication to innovation and excellence. With his unique patents and collaborative efforts, he continues to influence the trajectory of research and development, paving the way for future advancements in nanoscale measurement technologies.