La Jolla, CA, United States of America

Linjing Fang

This inventor holds 1 USPTO granted patent. Top assignee: The Salk Institute. Active years: 2024.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Linjing Fang: Innovator in Enhanced Imaging and Analysis

Introduction

Linjing Fang is a notable inventor based in La Jolla, California. He has made significant contributions to the field of imaging and analysis through his innovative methods and systems. His work is particularly focused on enhancing the capabilities of imaging technologies.

Latest Patents

Linjing Fang holds a patent for "Systems and methods for enhanced imaging and analysis." This patent describes a method for collecting images from samples. The method involves selecting a radiation level for a first probe to achieve a desired radiation dosage. It also includes providing radiation at a selected point within a region of the sample. Furthermore, the method identifies a second selected point based on a down sampling scheme and provides a second radiation amount at that point. The process also interpolates data to form an image of the sample region.

Career Highlights

Linjing Fang is associated with the Salk Institute, where he conducts research and develops innovative imaging techniques. His work has contributed to advancements in the field, showcasing his expertise and dedication to scientific progress. He has a total of 1 patent to his name, reflecting his commitment to innovation.

Collaborations

Linjing Fang collaborates with Uri Manor, a fellow researcher at the Salk Institute. Their partnership enhances the research output and fosters a collaborative environment for innovation.

Conclusion

Linjing Fang is a prominent inventor whose work in enhanced imaging and analysis has the potential to impact various scientific fields. His contributions at the Salk Institute and his innovative patent demonstrate his commitment to advancing technology.

Profile summary based on public USPTO records.
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