Chengdu, China

Ling Yan

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ling Yan. Retrieved from https://idiyas.com/inventor/ling-yan-h84v8n3r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ling Yan - Innovator in Log Processing Technology

Introduction

Ling Yan is a notable inventor based in Chengdu, China. He has made significant contributions to the field of log processing technology. His innovative approach has led to the development of a unique method, device, and computer program product aimed at enhancing the efficiency of log data management.

Latest Patents

Ling Yan holds 1 patent for his invention titled "Method, device, and computer program product for processing logs." This patent outlines a method that includes determining a target log recording component based on the duration of recently recorded log entries. It also involves identifying a log group with similar entries and updating these entries by removing duplicate content while retaining distinctive information.

Career Highlights

Ling Yan is currently employed at Dell Products Inc., where he applies his expertise in log processing. His work focuses on improving data management systems, which are crucial for various applications in technology and business.

Collaborations

Ling has collaborated with several talented individuals, including Changxu Jiang and Shuang Zheng, who contribute to the innovative environment at Dell Products Inc.

Conclusion

Ling Yan's contributions to log processing technology exemplify the impact of innovation in the tech industry. His work not only enhances data management but also sets a foundation for future advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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