Nanjing, China

Ling Tan

This inventor holds 1 USPTO granted patent. Top assignee: Nanjing University of Information Science & Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ling Tan. Retrieved from https://idiyas.com/inventor/ling-tan-1x6s0557

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Inventor Ling Tan

Introduction

Ling Tan is a notable inventor based in Nanjing, China. He has made significant contributions to the field of information science and technology. His work focuses on enhancing data identification methods, which are crucial in various applications.

Latest Patents

Ling Tan holds a patent for a "Multi-tag concurrent identification method and system for query tree based on feature groups." This innovative method involves dividing a whole data string space into several disjoint subsets based on the features of data strings returned by tags. Each subset contains different data strings, which can be identified simultaneously by a reader, improving efficiency in data processing.

Career Highlights

Ling Tan is affiliated with the Nanjing University of Information Science & Technology. His role at the university allows him to engage in cutting-edge research and development in the field of information technology. His contributions have been recognized within academic and professional circles.

Collaborations

Ling Tan has collaborated with notable colleagues, including Jian Su and Jialin Zhou. These collaborations have fostered a productive environment for innovation and research.

Conclusion

Ling Tan's work exemplifies the importance of innovation in technology. His patent and contributions to the field highlight his role as a leading inventor in data identification methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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