Hong Kong, China

Lin Zhang

This inventor holds 1 USPTO granted patent. Top assignee: The Hong Kong Polytechnic University. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lin Zhang. Retrieved from https://idiyas.com/inventor/lin-zhang-u1rkf1y0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2012

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Lin Zhang and Finger-Joint Print Identification

Introduction

Lin Zhang is an inventor associated with The Hong Kong Polytechnic University in Hong Kong, CN. His patent work includes a method and system for identifying a person using the print patterns around a finger’s proximal interphalangeal joint.

Latest Patents

Zhang is listed as an inventor on 1 patent: “Method and System for Identifying a Person Using Their Finger-Joint Print.” The method captures an image of a person’s finger-joint print and identifies a region of interest based on the print’s local convexity. It then uses an extended Gabor phase coding scheme to extract line-orientation features, represented in competitive code maps. The system compares the angular distance between those maps and reference data in a database to identify the person.

Career Highlights

The patent describes a biometric identification approach that uses the skin around the finger’s proximal interphalangeal joint. Its image-processing steps focus on isolating relevant print features and comparing them with stored reference information.

Collaborations

Zhang’s listed coworkers include David Zhang and Hailong Zhu. The available information identifies The Hong Kong Polytechnic University as his company affiliation.

Conclusion

Lin Zhang’s documented patent contribution concerns biometric identification through finger-joint print analysis, combining image capture, feature extraction, and database comparison.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…