Singapore, Singapore

Lin Jing



 

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013-2018

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2 patents (USPTO):Explore Patents

Title: Lin Jing - Innovator in Semiconductor Inspection Technologies

Introduction

Lin Jing is a prominent inventor based in Singapore, known for his contributions to semiconductor inspection technologies. With a focus on developing advanced systems for inspecting semiconductor wafers, he has made significant strides in the field of innovation.

Latest Patents

Lin Jing holds 2 patents that showcase his expertise in semiconductor inspection. His latest patents include a "System and method for inspecting a wafer," which features an inspection system designed to inspect semiconductor wafers using broadband illumination. This system incorporates various components, such as a first and second image capture device, tube lenses for collimation, and a stabilizing mechanism. Additionally, it includes a thin line illumination emitter and a third image capture device for capturing three-dimensional images of the wafer.

Another notable patent is the "Patterned wafer defect inspection system and method." This system allows for the inspection of semiconductor devices by selecting multiple regions from a wafer and generating golden templates for comparison. This innovative approach enhances the accuracy of defect detection in semiconductor manufacturing.

Career Highlights

Throughout his career, Lin Jing has worked with reputable companies in the semiconductor industry, including Semiconductor Technologies & Instruments Pte. Ltd. and Asti Holdings Limited. His experience in these organizations has contributed to his development of cutting-edge inspection technologies.

Collaborations

Lin Jing has collaborated with talented individuals in the field, including Ajharali Amanullah and Han Cheng Ge. These partnerships have fostered innovation and the advancement of semiconductor inspection methodologies.

Conclusion

Lin Jing's contributions to semiconductor inspection technologies through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence the field and drive advancements in semiconductor manufacturing processes.

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