Freiburg, Germany

Lin He

This inventor holds 1 USPTO granted patent. Top assignee: Albert-Ludwigs-Universitat Freiburg. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lin He. Retrieved from https://idiyas.com/inventor/lin-he-wrpqkjh2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovation Journey of Lin He

Introduction: Lin He, a talented inventor based in Freiburg, DE, has made significant contributions to the field of measuring devices with his innovative work.

Latest Patents: Lin He's latest patent is for a "Measuring device with a micro-electromechanical capacitive sensor," which revolutionizes the measurement of mechanical deflection using electrodes that move towards and away from each other. This patent showcases his prowess in developing cutting-edge technologies.

Career Highlights: Lin He is affiliated with Albert-Ludwigs-Universität Freiburg, where he continues to push the boundaries of innovation in collaboration with esteemed colleagues. His dedication to research and development has led to the creation of groundbreaking inventions that have the potential to shape the future of the industry.

Collaborations: Lin He has had the privilege of working alongside renowned experts in the field, such as Yiannos Manoli and Alexander Buhmann. This collaborative effort has not only fostered a culture of innovation but has also resulted in the successful implementation of patented technologies that have garnered international recognition.

Conclusion: Lin He's relentless pursuit of innovation and his commitment to excellence have established him as a trailblazer in the realm of inventors. His groundbreaking work continues to inspire and shape the landscape of technological advancements, setting new standards for measuring devices and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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