Company Filing History:
Years Active: 2023-2024
Title: Innovations by Lili Han in Defect Detection and Image Processing
Introduction
Lili Han is an accomplished inventor based in Ningde, China. She has made significant contributions to the fields of defect detection and image processing, holding two patents that showcase her innovative approach to technology.
Latest Patents
Lili Han's latest patents include a "Method and System for Defect Detection" and an "Image Processing Method." The defect detection method involves acquiring a two-dimensional picture of an object, utilizing a trained defect segmentation model to generate a segmented defect mask, and determining the defect based on predefined rules. This innovative approach enhances the accuracy of defect detection in various applications. The image processing method focuses on obtaining both two-dimensional and three-dimensional images, extracting luminance and depth information, and aligning these images to create fused data that incorporates color and depth information. This method significantly improves image analysis and processing capabilities.
Career Highlights
Lili Han is currently employed at Contemporary Amperex Technology Co., Ltd., where she applies her expertise in developing advanced technologies. Her work has contributed to the company's reputation as a leader in innovation within the industry.
Collaborations
Lili collaborates with talented coworkers, including Annan Shu and Chao Yuan, who contribute to her projects and enhance the overall innovation process.
Conclusion
Lili Han's contributions to defect detection and image processing demonstrate her commitment to advancing technology. Her patents reflect her innovative spirit and dedication to improving industry standards.