Chengdu, China

Liji Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Chengdu Aircraft Industrial (Group) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Liji Zhang. Retrieved from https://idiyas.com/inventor/liji-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 15.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Liji Zhang - Innovator in Anomaly Detection Technologies

Introduction

Liji Zhang is a prominent inventor based in Chengdu, China. He has made significant contributions to the field of anomaly detection through his innovative methods and devices. His work focuses on identifying the root causes of anomalies in various systems, which is crucial for improving system reliability and performance.

Latest Patents

Liji Zhang holds a patent for "Methods, devices, and electronic devices for locating anomaly root causes." This patent outlines a comprehensive method for identifying the root causes of anomalies in target systems. The process involves obtaining an anomaly indicator, analyzing a data item set, and determining the anomaly data item based on fluctuations. Ultimately, this method aids in locating the root cause of the anomaly, enhancing the efficiency of system diagnostics.

Career Highlights

Liji Zhang is associated with Chengdu Aircraft Industrial (Group) Co., Ltd., where he applies his expertise in developing advanced technologies. His innovative approach has positioned him as a key figure in the field of electronic devices and anomaly detection.

Collaborations

Liji collaborates with talented individuals such as Shangchao Wang and Aidi Lei, who contribute to his projects and research endeavors. Their combined efforts enhance the development of cutting-edge technologies in their field.

Conclusion

Liji Zhang's contributions to anomaly detection technologies demonstrate his commitment to innovation and excellence. His patent and collaborative efforts reflect his significant impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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