Taoyuan, Taiwan

Liang-Chien Chu

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Liang-Chien Chu. Retrieved from https://idiyas.com/inventor/liang-chien-chu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 77(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations of Liang-Chien Chu in 3D Scanning Technology.

Introduction

Liang-Chien Chu is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of 3D scanning technology. His innovative work focuses on utilizing infrared technology to enhance the accuracy and efficiency of 3D scanning systems.

Latest Patents

Liang-Chien Chu holds a patent for an infrared 3D scanning system. This patent describes a system that employs multiple infrared detectors to detect objects. It computes the 3D shape and temperature distribution of the object through advanced signal processing techniques. This innovation represents a significant advancement in the field of thermal imaging and 3D scanning.

Career Highlights

Liang-Chien Chu is affiliated with the Industrial Technology Research Institute, where he has been instrumental in developing cutting-edge technologies. His work has garnered attention for its practical applications in various industries, including manufacturing and quality control.

Collaborations

Liang-Chien Chu has collaborated with fellow researcher Chih-Chi Chang. Their partnership has led to advancements in the field of infrared technology and its applications in 3D scanning.

Conclusion

Liang-Chien Chu's contributions to infrared 3D scanning technology highlight his innovative spirit and dedication to advancing the field. His work continues to influence the development of more efficient and accurate scanning systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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