Foshan, China

Lianbao Ke

This inventor holds 1 USPTO granted patent. Top assignee: Ji Hua Laboratory. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lianbao Ke. Retrieved from https://idiyas.com/inventor/lianbao-ke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Lianbao Ke and Micro-LED Inspection Innovation.

Introduction

Lianbao Ke is an inventor associated with Foshan, China, and Ji Hua Laboratory. His patent work addresses inspection of micro light-emitting diodes, or micro-LEDs, using laser excitation and hyperspectral imaging.

Latest Patents

The provided information lists one patent for Lianbao Ke: “Micro light-emitting diode detection system and detection method.” The system directs a laser-containing light signal toward multiple micro-LEDs, which emit responsive light signals. A hyperspectral camera captures those signals and produces a spectral imaging frame containing data for each diode. A connected control module analyzes the frame to identify defective micro-LEDs. This approach combines optical excitation and spectral analysis to support detection across multiple devices. Ke is credited with 1 patent in the supplied data.

Career Highlights

Ke’s listed patent reflects work on inspection technology for micro-LEDs, a component used in display applications. His association with Ji Hua Laboratory connects his disclosed invention to an organization engaged in research and development.

Collaborations

The supplied information names Wei Wang and Hai Bi as Ke’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Lianbao Ke’s listed invention applies laser-based excitation and hyperspectral imaging to identify defective micro-LEDs, highlighting a focused contribution to semiconductor-device inspection technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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