This inventor holds 1 USPTO granted patent. Top assignee: Data Storage Institute. Active years: 2003.
Company Filing History:
Years Active: 2003
Title: Innovations of Lian Boon Koh in Laser Marking Technology
Introduction
Lian Boon Koh is a notable inventor based in Singapore, recognized for his contributions to the field of laser marking technology. His innovative approach has led to the development of methods that enhance the identification and traceability of hard disk media without compromising their integrity.
Latest Patents
Lian Boon Koh holds a patent for a "Method and apparatus for providing ablation-free laser marking on hard disk media." This invention describes a technique for creating visible markings on multi-layer hard disk magnetic storage media through laser-induced deformation. The method ensures that the protective carbon layer remains intact, preserving the multi-layered structure of the media. The apparatus includes a laser generator, a rotatable optical plate, and a beamsplitter, which allows for controlled fluence of the laser beam without altering the power settings. This innovative technique is particularly beneficial for marking finished hard disks, addressing identification and traceability needs while avoiding contamination issues.
Career Highlights
Lian Boon Koh is affiliated with the Data Storage Institute, where he has made significant strides in research and development. His work has not only advanced the technology of laser marking but has also contributed to the broader field of data storage solutions.
Collaborations
Throughout his career, Lian has collaborated with esteemed colleagues such as Teng Soon Wee and Daming Liu. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Lian Boon Koh's contributions to laser marking technology exemplify the intersection of innovation and practical application in the data storage industry. His patented methods and collaborative efforts continue to influence advancements in this critical field.
