Li-Wei Ko

Title: Inventor Spotlight: Li-Wei Ko

Introduction

Li-Wei Ko, an innovative inventor based in New Taipei, Taiwan, holds three patents that showcase his remarkable contributions to the field of integrated circuit technology. With a focus on enhancing testing methods and voltage regulation, Ko's work is influential in the realm of electronics.

Latest Patents

Among his latest achievements is the patent for "Heterogeneous voltage-based testing via on-chip voltage regulator circuits." This invention presents an integrated circuit that integrates various subunits operating at distinct voltages. It features voltage regulator circuits capable of converting an input voltage into multiple output voltages, effectively improving testing capabilities.

Another notable patent by Ko is "Timing-aware testing," which aims to streamline silicon chip testing processes. By dividing test patterns into segments based on timing, order, and frequency, this approach allows each segment to be executed at the highest frequency it can support independently. This method significantly reduces the overall time required for testing in a development environment.

Career Highlights

Li-Wei Ko has gained valuable experience through his tenure at several leading technology companies, including Nvidia Corporation and Hongfujin Precision Industry (Wuhan) Co., Ltd. His work at these firms has been pivotal in shaping advanced electronic testing and regulation methodologies.

Collaborations

Throughout his career, Ko has collaborated with talented professionals in the field, including his coworkers Shang-Ju Lee and Francisco M Da Silva. Their collective expertise and insights have undoubtedly contributed to the success of his innovative projects.

Conclusion

Li-Wei Ko continues to demonstrate remarkable ingenuity in the electronics industry. His patents reflect a deep understanding of complex technological challenges, paving the way for efficient testing solutions in modern electronics. As he expands his portfolio, Ko remains a noteworthy figure in the ongoing evolution of integrated circuit technology.