Hsinchu, Taiwan

Li-Ming Wu

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Li-Ming Wu. Retrieved from https://idiyas.com/inventor/li-ming-wu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Li-Ming Wu and Charge Pulse-Width Modulation Control.

Introduction

Li-Ming Wu is an inventor associated with Hsinchu, Taiwan, and the Industrial Technology Research Institute. The supplied information identifies one patent associated with Wu.

Latest Patents

Wu’s listed patent is “Method and Apparatus for Charge Pulse-Width Modulation Control.” It describes a charge-mode pulse-width modulation system that detects current on a transformer’s primary side and feeds the detected current to a current source. An integrator uses the current output to produce a voltage reference for a main controller, which determines whether to switch a control switch. The described approach is intended to help prevent transformer magnetic saturation and reduce noise in the feedback current signal. Wu is credited with 1 patent in the information provided.

Career Highlights

Wu’s listed work connects to power-conversion control and transformer protection. The patent describes combining current detection, charge integration, and voltage-mode control in a feedback system.

Collaborations

The supplied information names Chean-Lung Tsay and Khang-Shen Kwan as Wu’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Li-Ming Wu’s listed patent presents a charge pulse-width modulation control method designed to support stable transformer operation and reduce feedback noise.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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