Li Ma

Title: Innovations by Li Ma in Product Defect Detection

Introduction

Li Ma is an accomplished inventor based in Shandong, China. He has made significant contributions to the field of product defect detection. His innovative approach combines advanced technologies to enhance the accuracy and efficiency of identifying defects in products.

Latest Patents

Li Ma holds a patent for a "Product defect detection method, device and system." This invention involves constructing a defect detection framework that includes a classification network, a locating detection network, and a judgment network. The method trains the classification network using sample images of products with various defect types. This enables the classification network to effectively identify the types of defects present in the images. Additionally, the locating detection network is trained to pinpoint the location of each defect type within the sample image. By inputting an acquired product image into the defect detection framework, the system can determine whether the product has defects and identify the type and position of any defects present.

Career Highlights

Li Ma is currently employed at Goertek Inc., where he continues to develop innovative solutions in product defect detection. His work has garnered attention for its practical applications in improving product quality and reliability.

Collaborations

Li Ma collaborates with talented colleagues, including Jie Liu and Liang Zhang, who contribute to the success of their projects. Their teamwork fosters a creative environment that drives innovation.

Conclusion

Li Ma's contributions to product defect detection exemplify the impact of innovative thinking in technology. His patent and ongoing work at Goertek Inc. highlight the importance of advancements in quality control processes.