Tainan, Taiwan

Li-Jie Chen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industrial Technology Research Institute. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Li-Jie Chen. Retrieved from https://idiyas.com/inventor/li-jie-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Li-Jie Chen and Process Trend Analysis

Introduction

Li-Jie Chen is an inventor associated with Tainan, Taiwan. Her work includes a patented method and system for analyzing process factors that affect trends in continuous processes.

Latest Patents

Chen’s listed patent is “Method and System for Analyzing Process Factors Affecting Trend of Continuous Process.” The invention selects similar time periods from a time series by comparing their process trends with the trend in a current period. It then analyzes how process factors contribute to a monitored target, using factor values from those periods and the target’s monitored values, and identifies selected factors according to their contributions. Chen has 1 patent listed in the information provided.

Career Highlights

Chen is associated with the Industrial Technology Research Institute. Her patent focuses on analyzing process data to identify factors that may influence the direction of a continuous process.

Collaborations

The provided information names Jun-Bin Yeh and Chi-Chun Hsia as Chen’s coworkers. It does not specify whether they collaborated on the listed patent.

Conclusion

Li-Jie Chen’s listed invention applies time-series comparisons and contribution analysis to help identify process factors affecting continuous-process trends.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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