Li-Hsun Chen

Title: Innovations of Li-Hsun Chen in Burn-In Testing Technology.

Introduction

Li-Hsun Chen is a notable inventor based in Tao-Yuan Hsien, Taiwan. He has made significant contributions to the field of testing apparatuses, particularly in the area of burn-in testing for display-panel modules. His innovative approach has led to the development of a unique testing apparatus that enhances the reliability and efficiency of electronic components.

Latest Patents

Li-Hsun Chen holds a patent for a burn-in testing apparatus. This apparatus includes a thermal control chamber with a test room, where the temperature is maintained within a specific testing range. It features a carrier frame equipped with a direction guiding unit, which has a guiding groove and a carrier rod that extends through it. The clamping unit on the carrier rod securely holds a display-panel module. The design allows for the movement of the carrier rod within the guiding groove, enabling the display-panel module to be positioned along various testing directions for effective burn-in testing.

Career Highlights

Li-Hsun Chen is associated with Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work at Chroma Ate Inc. has been instrumental in advancing the technology used in electronic testing. His innovative designs and patents have contributed to the company's reputation as a leader in the industry.

Collaborations

Li-Hsun Chen has collaborated with notable colleagues, including Chi-Ren Chen and Chiang-Cheng Fan. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies in the field of testing apparatuses.

Conclusion

Li-Hsun Chen's contributions to burn-in testing technology exemplify the impact of innovative thinking in the electronics industry. His patent and work at Chroma Ate Inc. highlight the importance of reliable testing methods for electronic components.