Company Filing History:
Years Active: 2025
Title: Innovations of Li-Hao Yeh in Optical Measurement Technologies
Introduction
Li-Hao Yeh is a prominent inventor based in San Francisco, CA, known for her significant contributions to the field of optical measurement technologies. With a total of two patents to her name, she has developed innovative methods that enhance the understanding of optical properties in various specimens.
Latest Patents
Li-Hao Yeh's latest patents include a "Method and system for quantitative three-dimensional measurement of density, anisotropy, and orientation without label" and a "Method and system for spectral imaging of density, anisotropy, and orientation." The first patent outlines a method for measuring optical properties of a specimen, such as a uniaxial specimen, by generating multiple illumination patterns and collecting sample light. This process involves using a polarization state analyzer to form polarization channels and converting these channels into Stokes parameter maps for volumetric measurement of the specimen's permittivity tensor. The second patent focuses on measuring optical properties by generating illumination light at various wavelengths, collecting sample light, and utilizing a polarization state analyzer to create polarization channels. This method allows for multiplexing intrinsic measurements of density, anisotropy, and orientation.
Career Highlights
Li-Hao Yeh works at Cz Biohub SF, LLC, where she continues to push the boundaries of optical measurement technologies. Her work has been instrumental in advancing the understanding of optical properties in various applications, making her a valuable asset in her field.
Collaborations
Li-Hao Yeh collaborates with notable colleagues, including Shalin Mehta and Ivan Ivanov, contributing to a dynamic research environment that fosters innovation and discovery.
Conclusion
Li-Hao Yeh's innovative patents and contributions to optical measurement technologies highlight her role as a leading inventor in her field. Her work not only advances scientific understanding but also paves the way for future innovations in optical measurement.