The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Nov. 16, 2022
CZ Biohub Sf, Llc, San Francisco, CA (US);
Shalin Mehta, San Francisco, CA (US);
Li-Hao Yeh, San Francisco, CA (US);
Ivan Ivanov, San Francisco, CA (US);
CZ Biohub SF, LLC, San Francisco, CA (US);
Abstract
A method of measuring optical properties of a specimen, for example, a uniaxial specimen, includes generating a plurality of illumination patterns incident on the specimen and, for each of the plurality of illumination patterns, collecting sample light passing through the specimen and detecting the collected sample light using a polarization state analyzer to form a set of polarization channels. The method also includes receiving a calibration tensor, converting the set of polarization channels for each of the illumination patterns into Stokes parameter maps using the calibration tensor, and deconvolving the Stokes parameter maps to provide volumetric measurement of permittivity tensor of the specimen, specifically, absorption, optical path length, optical anisotropy, and 3D orientation of the specimen.