This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignees: Integrated Dynamic Electron Solutions, Inc., Trinity College Dublin. Active years: 2023.
Company Filing History:
1 out of 10 
1 out of 141 
Years Active: 2023
Title: Lewys Jones: Innovator in Electron Microscopy
Introduction
Lewys Jones is a notable inventor based in Finglas East, Ireland. He has made significant contributions to the field of electron microscopy, particularly through his innovative methods and systems.
Latest Patents
Lewys Jones holds a patent for "Methods and systems for event modulated electron microscopy." This patent describes a method for measuring an electron signal or an electron-induced signal. The method includes providing a threshold number of events or a threshold event rate for a pixel on a detector. It also involves collecting from the detector the threshold number of events or determining that the threshold event rate is achieved. The signal at the detector can be an electron signal or an electron-induced signal from a sample. Additionally, the method includes modulating the intensity of an electron source directed to the sample in response to these measurements. He has 1 patent to his name.
Career Highlights
Throughout his career, Lewys Jones has worked with various organizations that have contributed to his expertise in electron microscopy. Notably, he has been associated with Integrated Dynamic Electron Solutions, Inc. and Trinity College Dublin. His work in these institutions has allowed him to refine his skills and develop innovative solutions in his field.
Collaborations
One of his notable coworkers is Bryan Walter Reed. Their collaboration has likely contributed to advancements in their shared field of research.
Conclusion
Lewys Jones is a distinguished inventor whose work in electron microscopy has led to significant advancements. His innovative methods continue to influence the field and inspire future research.