Leroy R Bannach

Title: Leroy R. Bannach: Innovator in Eddy Current Probes

Introduction

Leroy R. Bannach is a notable inventor based in San Diego, CA. He has made significant contributions to the field of measurement technology, particularly through his innovative work on eddy current probes. His expertise and creativity have led to the development of a unique patent that enhances the functionality of these devices.

Latest Patents

Leroy R. Bannach holds a patent for a "Digitally Linearizing Eddy Current Probe." This invention involves the demodulation of the output from an eddy current probe, which is then linearized using an analog to digital converter, a digital signal processor, and a memory. The linearized digital output signal is subsequently converted back to an analog signal, with the voltage being directly proportional to the position of the conductive target in relation to the probe. This advancement improves the accuracy and reliability of measurements in various applications.

Career Highlights

Bannach is associated with SKF Condition Monitoring Inc., where he applies his skills and knowledge to further develop innovative solutions in condition monitoring technology. His work at SKF has allowed him to contribute to the advancement of industrial measurement techniques.

Collaborations

Throughout his career, Bannach has collaborated with talented professionals, including John T. Barclay and Phillip L. Maness. These collaborations have fostered an environment of innovation and have led to the successful development of new technologies.

Conclusion

Leroy R. Bannach's contributions to the field of eddy current probes exemplify the impact of innovation in measurement technology. His patent and work at SKF Condition Monitoring Inc. highlight his dedication to advancing industrial applications.