Leon Lee Chen

Title: Innovations by Leon Lee Chen in Semiconductor Testing

Introduction

Leon Lee Chen is an accomplished inventor based in Santa Clara, CA. He has made significant contributions to the field of semiconductor testing through his innovative patent. His work focuses on improving the efficiency of data transfer in semiconductor test systems.

Latest Patents

Leon Lee Chen holds a patent for "Pattern data compression and decompression for semiconductor test system." This invention involves a compression and decompression apparatus designed to transfer test pattern data from a storage device of a host computer to a pattern memory in a semiconductor test system. The goal is to decrease the time required for data transfer. The apparatus includes a compression means that classifies vector data into two groups: one to be compressed into a short code and another that remains uncompressed. It also produces a look-up table that shows the relationship between the short code and the vector data. The compressed test pattern file stores the compressed data, and a hardware decompression circuit decompresses the data based on the short code and the look-up table.

Career Highlights

Leon Lee Chen is currently employed at Adv Antest Corporation, where he continues to work on advancements in semiconductor testing technologies. His expertise in data compression techniques has positioned him as a valuable asset in the industry.

Collaborations

Leon collaborates with James Alan Turnquist, leveraging their combined knowledge to enhance the development of semiconductor testing solutions.

Conclusion

Leon Lee Chen's innovative work in semiconductor testing exemplifies the importance of advancements in technology. His patent for data compression and decompression significantly contributes to the efficiency of semiconductor test systems.