Valkenburg, Netherlands

Leon Ferdinand Gerard Geers

This inventor holds 2 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignee: Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno. Active years: 2013-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Leon Ferdinand Gerard Geers. Retrieved from https://idiyas.com/inventor/leon-ferdinand-gerard-geers

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2013-2015

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2 patents (USPTO):Explore Patents

Title: Leon Ferdinand Gerard Geers: Innovator in Applied Sciences

Introduction

Leon Ferdinand Gerard Geers is a notable inventor based in Valkenburg, Netherlands. He is associated with the Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek TNO, a prominent research organization focused on applied scientific research. Despite having no patents to his name, Geers has made significant contributions to the field of applied sciences.

Latest Patents

Currently, Leon Ferdinand Gerard Geers holds 2 patents. This indicates that his work may be more focused on research and development rather than patenting inventions.

Career Highlights

Geers has had a distinguished career at TNO, where he has been involved in various projects that aim to bridge the gap between scientific research and practical applications. His work has contributed to advancements in technology and innovation within the organization.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Leon Ferdinand Gerard Geers is an influential figure in the realm of applied sciences, contributing to research and development at TNO. His dedication to innovation continues to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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