Company Filing History:
Years Active: 2004
Title: Innovations by Leo C. Mooney
Introduction
Leo C. Mooney is an accomplished inventor based in Cedar Park, TX (US). He has made significant contributions to the field of computer systems and integrated circuit devices. With a total of 2 patents, his work has had a notable impact on technology.
Latest Patents
One of his latest patents is titled "Standardized format for reporting error events occurring within logically partitioned multiprocessing systems." This invention describes a method, system, and product for reporting error events within a computer system that includes multiple logical partitions, each with different operating systems. The patent specifies a format for reporting these error events, ensuring that information is consistently formatted and utilized across various operating systems.
Another significant patent by Mooney is "Data processing system, method, and product for automatically tracking insertions of integrated circuit devices." This invention provides a system and method for automatically detecting the insertion of integrated circuit devices into receptacle devices. The system increments an insertion count associated with the integrated circuit device, allowing for efficient tracking of insertions.
Career Highlights
Leo C. Mooney is currently associated with International Business Machines Corporation (IBM), where he continues to innovate and contribute to advancements in technology. His work at IBM has allowed him to explore various aspects of computer systems and integrated circuits.
Collaborations
Throughout his career, Mooney has collaborated with notable colleagues, including George Henry Ahrens, Jr. and Douglas Marvin Benignus. These collaborations have further enriched his work and contributed to the development of innovative solutions in the tech industry.
Conclusion
Leo C. Mooney's contributions to technology through his patents and work at IBM highlight his role as a significant inventor in the field. His innovative solutions continue to influence the way error events are reported and integrated circuit devices are tracked.