Hamburg, Germany

LeiLei Chen

This inventor holds 1 USPTO granted patent. Top assignee: Airbus Deutschland Gmbh. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: LeiLei Chen. Retrieved from https://idiyas.com/inventor/leilei-chen-87jpdm76

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: LeiLei Chen - Innovator in Aircraft Monitoring Systems

Introduction

LeiLei Chen is a prominent inventor based in Hamburg, Germany. She has made significant contributions to the field of aircraft technology, particularly in the monitoring of air outlet valves. Her innovative approach enhances the safety and efficiency of aircraft operations.

Latest Patents

LeiLei Chen holds a patent for a "Support system for the monitoring of an air outlet valve in an aircraft." This invention proposes the use of a camera to capture a technical image of an air outlet valve. The image is displayed on a picture display unit, such as in the cockpit of the aircraft. By illuminating the outlet valve with a light source, a clear and high-contrast image is produced. This allows pilots to visually monitor the valve setting reliably.

Career Highlights

LeiLei Chen is currently employed at Airbus Deutschland GmbH, where she continues to develop innovative solutions for the aviation industry. Her work focuses on enhancing the safety and functionality of aircraft systems.

Collaborations

LeiLei collaborates with talented colleagues, including Thorsten Schiek and Thomas Heuer, who contribute to her projects and innovations.

Conclusion

LeiLei Chen's contributions to aircraft technology exemplify her commitment to innovation and safety in aviation. Her patent for monitoring air outlet valves showcases her ability to merge technology with practical applications in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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