Company Filing History:
Years Active: 2002-2013
Title: Leif X Running: Innovator in Signal Analysis Technology
Introduction
Leif X Running is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of signal analysis, holding a total of 4 patents. His work focuses on enhancing the functionality and efficiency of signal analysis devices.
Latest Patents
One of Leif's latest patents is titled "Region overlap control for autorange/autoset functions." This invention introduces a method for controlling the overlap of multiple waveforms displayed on an instrument. It allows users to select a vertical height for each waveform, ensuring that they are displayed in an overlapping manner that enhances measurement functions and secondary functions, such as harmonics and switching loss measurements. Another significant patent is the "Calibration method and apparatus for signal analysis device." This invention provides a method for calibrating signal probes associated with a signal analysis device, which involves storing existing input channel parameters, performing calibration procedures, and restoring operational parameters.
Career Highlights
Leif X Running is currently employed at Tektronix, Inc., a company renowned for its innovative electronic test and measurement equipment. His work at Tektronix has allowed him to develop and refine technologies that are crucial for accurate signal analysis.
Collaborations
Leif has collaborated with several talented individuals in his field, including Jerry L Wrisley and Kevin C Ayers. These collaborations have contributed to the advancement of technology in signal analysis and have fostered a creative environment for innovation.
Conclusion
Leif X Running is a distinguished inventor whose contributions to signal analysis technology have made a significant impact in the industry. His patents reflect his commitment to improving measurement techniques and enhancing user experience in electronic instrumentation.