Lei Zuo

Title: Lei Zuo: Innovator in Analog Circuit Fault Diagnosis

Introduction

Lei Zuo is a prominent inventor based in Anhui, China. He has made significant contributions to the field of analog circuit fault diagnosis, holding a total of 4 patents. His innovative methods have advanced the techniques used in diagnosing faults in analog circuits, showcasing his expertise and dedication to the field.

Latest Patents

Lei Zuo's latest patents include two notable methods for diagnosing analog circuit faults. The first patent, titled "Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation," outlines a systematic approach that involves acquiring a fault response voltage signal, performing wavelet packet transform, and utilizing a quantum particle swarm optimization algorithm to train a fault diagnosis model. The second patent, "Method for diagnosing analog circuit fault based on cross wavelet features," describes a process that includes inputting an excitation signal, collecting response output signals, and applying bidirectional two-dimensional linear discriminant analysis to extract fault feature vectors for classification.

Career Highlights

Lei Zuo is affiliated with Hefei University of Technology, where he continues to contribute to research and development in his field. His work has not only advanced theoretical knowledge but has also provided practical solutions for real-world applications in circuit diagnostics.

Collaborations

Lei Zuo has collaborated with several colleagues, including Yigang He and Wei He, who have contributed to his research endeavors. Their combined expertise has enhanced the quality and impact of their work in the field of analog circuit diagnostics.

Conclusion

In summary, Lei Zuo is a distinguished inventor whose innovative methods for diagnosing analog circuit faults have made a significant impact in the field. His contributions continue to influence both academic research and practical applications in circuit diagnostics.