The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Dec. 07, 2017
Applicant:

Hefei University of Technology, Anhui, CN;

Inventors:

Yigang He, Anhui, CN;

Wei He, Anhui, CN;

Baiqiang Yin, Anhui, CN;

Bing Li, Anhui, CN;

Zhigang Li, Anhui, CN;

Lei Zuo, Anhui, CN;

Chaolong Zhang, Anhui, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3163 (2006.01); G01R 31/28 (2006.01); G06F 17/17 (2006.01); G06N 7/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3163 (2013.01); G01R 31/287 (2013.01); G01R 31/2884 (2013.01); G06F 17/17 (2013.01); G06N 7/043 (2013.01);
Abstract

A vector-valued regularized kernel function approximation (VVRKFA) based fault diagnosis method for an analog circuit comprises the following steps: (1) obtaining fault response voltage signals of an analog circuit; (2) performing wavelet packet transform on the collected signals, and calculating wavelet packet coefficient energy values as feature parameters; (3) optimizing regularization parameters and kernel parameters of VVRKFA by using a quantum particle swarm optimization algorithm and training a fault diagnosis model; and (4) identifying a circuit fault by using the trained diagnosis model. In the invention, the classification performance of the VVRKFA method is superior to other classification algorithms, and optimization of parameters by the quantum particle swarm optimization (QPSO) algorithm is also superior to the traditional method of obtaining parameters. The fault diagnosis method provided by the invention can efficiently diagnose the component faults of the circuit, including soft faults and hard faults.


Find Patent Forward Citations

Loading…