Zhejiang, China

Lei Zheng

This inventor holds 1 USPTO granted patent. Top assignee: Hangzhou Dptech Technologies Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Zheng. Retrieved from https://idiyas.com/inventor/lei-zheng-lewpmswd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Lei Zheng: Innovator in Fault Detection Technology

Introduction

Lei Zheng is a prominent inventor based in Zhejiang, China. She has made significant contributions to the field of fault detection technology, particularly in the context of Link Aggregation Control Protocol (LACP). Her innovative approach addresses critical issues in network reliability and performance.

Latest Patents

Lei Zheng holds a patent for a fault detection method for LACP packet timeout. This patent outlines a comprehensive process that includes receiving a LACP packet from a target port of a partner device through a local port. The method involves sending a response LACP packet back to the target port and generating a LACP service processing entry. In cases where no LACP packet is received for a preset waiting time, the method performs fault detection based on the phase identifier and the LACP service processing entry to identify the cause of the timeout.

Career Highlights

Lei Zheng is currently employed at Hangzhou Dptech Technologies Co., Ltd. Her work at this company has allowed her to focus on developing advanced technologies that enhance network communication and reliability. Her expertise in fault detection has positioned her as a key player in her field.

Collaborations

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Conclusion

Lei Zheng's contributions to fault detection technology exemplify her innovative spirit and dedication to improving network systems. Her patent reflects her commitment to advancing technology in meaningful ways.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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