Tianjin, China

Lei Tian

This inventor holds 1 USPTO granted patent. Top assignee: Tianjin University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Tian. Retrieved from https://idiyas.com/inventor/lei-tian-3yao6r6b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Lei Tian - Innovator in Detection Technology

Introduction

Lei Tian is a prominent inventor based in Tianjin, China. He has made significant contributions to the field of detection technology. His innovative approach has led to the development of a unique detection device that enhances the efficiency of node detection.

Latest Patents

Lei Tian holds a patent for a "Detection device and detection method for node detection." This device includes a frame body, a main pipe positioning assembly, a branch pipe positioning assembly, and a first driving assembly. The design allows for precise adjustments to accommodate the positions of branch pipes during detection. The device's functionality is enhanced by its ability to open and close an opening using limiting members, ensuring accurate positioning of the main pipe.

Career Highlights

Lei Tian is affiliated with Tianjin University, where he continues to engage in research and development. His work focuses on advancing detection technologies that can be applied in various industries. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

Lei Tian collaborates with notable colleagues, including Lianyong Xu and Lei Zhao. Their combined expertise fosters a productive research environment that drives technological advancements.

Conclusion

In summary, Lei Tian is an influential inventor whose work in detection technology is paving the way for future innovations. His contributions are vital to the ongoing development of efficient detection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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