Xi'an, China

Lei Ran

This inventor holds 1 USPTO granted patent. Top assignees: China Jikan Research Institute of Engineering Investigations and Design, Co., Ltd, Xi'an Jiaotong University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Ran. Retrieved from https://idiyas.com/inventor/lei-ran-4nddmrp8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Lei Ran and His Patent for Soil Measurement Calibration.

Introduction

Lei Ran is an inventor based in Xi’an, China. His work includes a patent for calibrating non-invasive time domain reflection probes, which are used to measure soil moisture content and density.

Latest Patents

Ran is associated with 1 patent: “Non-invasive time domain reflection probe calibration method and system.” The method uses ethanol and deionized water mixtures to determine the probes’ sensitivity to the test medium and their waveguide length. It uses sodium chloride solutions to calibrate the probes’ geometric dimensions, then tests compacted soil samples with known moisture contents and densities to establish correlations between dielectric constant, conductivity, moisture content, and density. The approach is described as accurate, practical, and suitable for a wide range of applications.

Career Highlights

Ran has been associated with China Jikan Research Institute of Engineering Investigations and Design Co., Ltd. and Xi’an Jiaotong University. His patented calibration method addresses key measurement factors, including probe geometry and the relationship between soil properties and the probe’s readings.

Collaborations

Jie Cao and Long Wang are identified as Ran’s coworkers.

Conclusion

Lei Ran’s patent presents a calibration approach designed to improve the accuracy and practical use of non-invasive probes for measuring soil moisture and density.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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