Pezinok, Slovakia

Lei Liu

This inventor holds 1 USPTO granted patent. Top assignee: Sap Se. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Liu. Retrieved from https://idiyas.com/inventor/lei-liu-aasw7x8y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Lei Liu - Innovator in Data Access Privilege Management

Introduction

Lei Liu is a notable inventor based in Pezinok, Slovakia. He has made significant contributions to the field of data access management through his innovative patent. His work focuses on enhancing the security and efficiency of data access in applications.

Latest Patents

Lei Liu holds a patent titled "Transparent enforcement of application-level access privileges on data structures." This patent describes methods, systems, and computer-readable storage media for receiving a query from an application during its runtime. The process involves determining a data access privilege for a user concerning a specific artifact, modifying the query to include a filtering clause, and retrieving data that is responsive to this modified query.

Career Highlights

Currently, Lei Liu is employed at SAP SE, where he continues to develop innovative solutions in data management. His expertise in application-level access privileges has positioned him as a valuable asset in his field.

Collaborations

Lei Liu has collaborated with talented professionals such as Vengateswaran Chandrasekaran and Tomas Visnovec. These collaborations have further enriched his work and contributed to advancements in data access technologies.

Conclusion

In summary, Lei Liu is a distinguished inventor whose work in data access privilege management has made a significant impact in the tech industry. His innovative patent and contributions at SAP SE highlight his commitment to enhancing data security and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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