Calabasas, CA, United States of America

Lei Lei

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Delphi Technologies, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Lei. Retrieved from https://idiyas.com/inventor/lei-lei-ldrarnzv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Inventor Lei Lei

Introduction: Lei Lei is an accomplished inventor based in Calabasas, CA (US). He has made significant contributions to the field of object detection technology. His innovative work has led to the development of a patent that enhances the accuracy of object detection systems.

Latest Patents: Lei Lei holds a patent titled "Phase correction for object detection including TDMA." This patent describes an illustrative example of an object detection system that includes multiple transmitters and receivers. The system is designed to determine whether a transmission timing phase shift exists between received signals, improving the overall effectiveness of object detection.

Career Highlights: Lei Lei is currently employed at Delphi Technologies, Inc. His work at the company focuses on advancing technologies that enhance object detection capabilities. With a patent portfolio that includes 1 patent, he has established himself as a key player in his field.

Collaborations: Lei Lei collaborates with Branka Jokanovic, who is also a talented professional in the industry. Their partnership contributes to the innovative projects at Delphi Technologies, Inc.

Conclusion: Lei Lei's contributions to object detection technology exemplify the impact of innovation in the field. His patent and collaborative efforts continue to drive advancements in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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