Lei Lan

Title: Lei Lan - Innovator in Intelligent Quantitative Microscopic Identification Systems

Introduction

Lei Lan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of microscopic identification systems, particularly in the context of whole rock polished sections. His innovative approach has the potential to revolutionize the efficiency of sample collection in geological studies.

Latest Patents

Lei Lan holds a patent for an "Intelligent quantitative microscopic identification system and intelligent identification method for whole rock polished sections." This invention provides an intelligent quantitative microscopic identification system that greatly enhances the collection efficiency of whole rock polished sections. By utilizing a microscopic collecting apparatus, the system integrates seamlessly with production lines for the automatic preparation of these sections. This integrated system allows for an automatic process from preparation to collection, significantly improving both production and collection efficiency. The invention enables the collection of 500 to 1000 sample pieces of whole rock polished sections within a 12-hour timeframe, thereby enhancing the efficiency of microscopic image collection of organic components.

Career Highlights

Lei Lan is affiliated with Yangtze University, where he continues to advance his research and development in innovative technologies. His work has garnered attention for its practical applications in geological and material sciences.

Collaborations

Lei collaborates with notable colleagues, including Yan Liu and Feilong Wang, who contribute to his research endeavors and the development of his patented technologies.

Conclusion

In summary, Lei Lan is a distinguished inventor whose work in intelligent quantitative microscopic identification systems is paving the way for advancements in geological research. His innovative solutions are set to enhance the efficiency of sample collection and analysis in the field.