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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11841355 B1

PDFFull Text
Date of Patent:
Dec. 12, 2023

Filed:

Nov. 01, 2021

Intelligent quantitative microscopic identification system and intelligent identification method for whole rock polished sections

Applicant:

Yangtze University, Jingzhou, CN;

Inventors:

Yan Liu, Hubei, CN;

Feilong Wang, Tianjin, CN;

Zhigang Wen, Hubei, CN;

Qingyong Luo, Beijing, CN;

Lei Lan, Beijing, CN;

Shuchun Yang, Beijing, CN;

Yongjing Tian, Hubei, CN;

Yaohui Xu, Hubei, CN;

Guangyou Zhu, Beijing, CN;

Xiangchun Chang, Shandong, CN;

Meijun Li, Beijing, CN;

Assignee:

YANGTZE UNIVERSITY, Jingzhou, CN;

Attorneys:

Dragon Sun Law Firm, PC

Nathaniel Perkins

Primary Examiner:

Jamil Ahmed

Int. Cl.
CPC ...
G01N 33/24 (2006.01); G01N 1/32 (2006.01); G01N 21/88 (2006.01); G01N 21/01 (2006.01); G01N 1/28 (2006.01); G02B 21/06 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 33/24 (2013.01); G01N 1/286 (2013.01); G01N 1/32 (2013.01); G01N 21/01 (2013.01); G01N 21/8851 (2013.01); G02B 21/06 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); G01N 2001/2866 (2013.01); G01N 2021/8887 (2013.01);
Abstract

The invention provides an intelligent quantitative microscopic identification system for whole rock polished sections, which can greatly improve the collection efficiency of whole rock polished sections by adopting a microscopic collecting apparatus. In a preferable technical solution, the microscopic collecting apparatus is combined with the production line for the automatic preparation of whole rock polished sections to form an integrated system, which realizes an automatic solution from preparation to collection, therefore further improves the production and collection efficiency of whole rock polished sections, and which can cope with production, image collection and automatic scanning and splicing of mass whole rock polished sections, so it greatly improves the collection efficiency of the microscopic images of organic components for whole rock polished sections. People can collect 500 to 1000 sample pieces of whole rock polished sections in 12 hours by adopting the solution of the invention.

Find Patent Forward Citations

Liu, Yan. (2023). Intelligent quantitative microscopic identification system and intelligent identification method for whole rock polished sections (U.S. Patent No. 11841355). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11841355

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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