Zhenjiang, China

Lei Dai

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Jiangsu University. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Dai. Retrieved from https://idiyas.com/inventor/lei-dai-w7c3apu0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Lei Dai - Innovator in Machine Vision Technology

Introduction

Lei Dai is a prominent inventor based in Zhenjiang, China. He has made significant contributions to the field of machine vision, particularly in the area of night vision infrared imaging. His innovative approach has led to the development of a unique method for extracting road targets from infrared images.

Latest Patents

Lei Dai holds a patent for a "Saliency-based method for extracting road target from night vision infrared image." This invention combines various saliency factors, including time and frequency domain saliencies, global and local contrast, as well as low and high-level features. The method emphasizes energy radiation as a crucial saliency factor, allowing for more accurate and thorough extraction of salient regions in infrared images.

Career Highlights

Lei Dai is affiliated with Jiangsu University, where he continues to advance research in machine vision technologies. His work has garnered attention for its practical applications in improving the clarity and accuracy of target detection in challenging visual environments.

Collaborations

Lei has collaborated with notable colleagues, including Yingfeng Cai and Hai Feng Wang, who have contributed to his research endeavors.

Conclusion

Lei Dai's innovative contributions to machine vision technology highlight the importance of interdisciplinary approaches in enhancing image processing techniques. His work continues to pave the way for advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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