Tokyo, Japan

Lei Chen

This inventor holds 1 USPTO granted patent. Top assignee: Rakuten Group, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lei Chen. Retrieved from https://idiyas.com/inventor/lei-chen-6vl89prs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Lei Chen - Innovator in Cross-Modal Contrastive Learning

Introduction

Lei Chen is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of artificial intelligence, particularly in the area of contrastive learning. His innovative approach aims to enhance item categorization using advanced models.

Latest Patents

Lei Chen holds a patent titled "Method, system and storage medium implementing cross-modal contrastive learning to improve item categorization BERT model." This patent describes a method of contrastive learning performed by at least one processor. The process includes receiving a text title corresponding to an anchor, generating a text representation of the title, and constructing a positive pair between the text representation and an image representation.

Career Highlights

Currently, Lei Chen is associated with Rakuten Group, Inc., where he applies his expertise in developing cutting-edge technologies. His work focuses on improving machine learning models to facilitate better categorization of items.

Collaborations

Lei collaborates with Hou Wei Chou, a talented woman in the field, contributing to various projects that push the boundaries of technology.

Conclusion

Lei Chen's innovative work in cross-modal contrastive learning exemplifies the potential of artificial intelligence in enhancing item categorization. His contributions are paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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