Wilmington, DE, United States of America

Lee H Nichols, Iii

This inventor holds 1 USPTO granted patent. Top assignee: E.i. Dupont De Nemours and Company. Active years: 1980.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lee H Nichols, Iii. Retrieved from https://idiyas.com/inventor/lee-h-nichols-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1980

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Lee H. Nichols, III: Innovator in On-Line Defect Zoning

Introduction

Lee H. Nichols, III is a notable inventor based in Wilmington, Delaware. He has made significant contributions to the field of product recovery through his innovative patent. His work focuses on optimizing the recovery of salvageable sheet products from large width webs, which is crucial in various manufacturing processes.

Latest Patents

Nichols holds a patent for an "Apparatus for On-Line Defect Zoning." This invention presents a non-marking method and apparatus designed to enhance the recovery of salvageable sheet products at on-line speeds. It is utilized in conjunction with a radiation scanning type inspection system, showcasing his commitment to advancing technology in product inspection and recovery.

Career Highlights

Nichols is currently employed at E.I. du Pont de Nemours and Company, a leading organization in the field of science and technology. His role at the company allows him to apply his innovative ideas and contribute to the development of advanced manufacturing processes.

Collaborations

One of his notable collaborators is Edmund H. Smith, Jr. Their partnership exemplifies the collaborative spirit in the field of innovation, as they work together to push the boundaries of technology and improve manufacturing efficiency.

Conclusion

Lee H. Nichols, III is a dedicated inventor whose work in on-line defect zoning has the potential to revolutionize product recovery processes. His contributions to the field reflect his innovative spirit and commitment to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…