Buda, TX, United States of America

Lee Allen Corley


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):

Title: Lee Allen Corley: Innovator in Integrated Circuit Testing

Introduction

Lee Allen Corley is a notable inventor based in Buda, Texas, renowned for his significant contributions to the field of integrated circuits. With one patent to his name, Corley has developed a unique testing method that enhances the functionality and reliability of integrated circuit devices.

Latest Patents

Corley's patent, titled "Scan Based Testing of an Integrated Circuit for Compliance with Timing," presents an innovative methodology for improving the testable design of integrated circuit (IC) devices. This invention revolves around a functional path integrated within the IC to fulfill functional specifications while employing a separate testing path to ensure compliance with timing specifications. The invention utilizes input and output switching devices that connect the IC's output terminals to flip-flop devices, facilitating a seamless transition between functional cycles and testing cycles. Additionally, the IC can disable tristate bus drivers during testing, ensuring accurate timing signal outputs.

Career Highlights

Throughout his professional journey, Lee Allen Corley has made significant strides in the technology sector. He is associated with Motorola Corporation, a company recognized for its dedication to telecommunications and consumer electronics. His work contributes to advancing the quality and efficiency of integrated circuit designs.

Collaborations

Corley has collaborated with esteemed colleagues, including Grady L. Giles and Alfred Larry Crouch, enhancing the innovative environment within which they work. Their joint efforts within Motorola Corporation have facilitated the development and refinement of cutting-edge technologies.

Conclusion

In conclusion, Lee Allen Corley’s contributions to integrated circuit testing demonstrate his commitment to innovation in the electronics industry. His patent highlights the importance of functionality and testing in IC design, solidifying his role as a prominent inventor in this specialized field.

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