Roggen, CO, United States of America

Lee A Sargent

This inventor holds 1 USPTO granted patent. Top assignee: Monfort, Inc.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lee A Sargent. Retrieved from https://idiyas.com/inventor/lee-a-sargent

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Innovations of Lee A. Sargent

Introduction

Lee A. Sargent is an accomplished inventor based in Roggen, Colorado. He has made significant contributions to the field of cutting edge technology through his innovative patent. His work focuses on enhancing the precision and effectiveness of cutting tools.

Latest Patents

Sargent holds a patent for an "Apparatus and method for testing the sharpness of cutting edges." This invention relates to a system designed to quantitatively measure the sharpness of cutting edges. The apparatus features gripper assemblies that secure a cutting medium, allowing for adjustments to specific angular orientations. It includes a sleeve that holds the edge, enabling contact with the cutting medium. An electric actuator facilitates the relative movement of the edge against the cutting medium, while a force strain gauge quantitatively measures the sharpness of the edge during this interaction.

Career Highlights

Lee A. Sargent is associated with Monfort, Inc., where he applies his expertise in developing innovative solutions. His work has contributed to advancements in the testing and measurement of cutting tools, showcasing his commitment to improving industry standards.

Collaborations

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Conclusion

Lee A. Sargent's innovative approach to measuring cutting edge sharpness exemplifies the importance of precision in tool technology. His contributions continue to influence the industry and enhance the effectiveness of cutting tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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